The main research interests are in the simulation and design of microelectronics circuits and their VLSI implementation. The scope of activities covers analog and digital simulation, functionality, testability, fabrication and testing.
Current interests are aimed at comprehensive testability analysis of CMOS, BiCMOS, and bipolar technologies with an emphasis on defect injection and fault mapping. There is also much research done on fault security analysis of systems where secureness is essential.
Current projects :
- Defects and faults analysis for current-mode logic circuits for Northern Telecom
- Fault security analysis of secure network systems for the Communication Security Establishment
- Development and automation of computer aided analysis tools for defect injection, fault classification, and measure of fault secureness.